发明名称 TEST AND MEASUREMENT INSTRUMENT HAVING ADVANCED TRIGGERING CAPABILITY
摘要 A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal, a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal, and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal validates or invalidates the first trigger signal.
申请公布号 US2015293170(A1) 申请公布日期 2015.10.15
申请号 US201414553405 申请日期 2014.11.25
申请人 Tektronix, Inc. 发明人 Knierim Daniel G.;Kelly David L.;Andrews Jed H.;Martin Michael A.;Smith Patrick A.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. A test and measurement instrument, comprising: an input configured to receive a signal-under-test; a user input configured to accept a first trigger event and a second trigger event from a user; a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal; a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal; and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal is generated by the second trigger decoder.
地址 Beaverton OR US