发明名称 |
INSTRUMENT CHANGING ASSEMBLY AND METHODS |
摘要 |
An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator. |
申请公布号 |
WO2015017765(A3) |
申请公布日期 |
2015.10.15 |
申请号 |
WO2014US49379 |
申请日期 |
2014.08.01 |
申请人 |
HYSITRON, INC. |
发明人 |
DAMA, RAJIV;ZIGELMAN, SVETLANA |
分类号 |
G01Q70/06;B82Y35/00;G01Q60/22 |
主分类号 |
G01Q70/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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