发明名称 APPARATUS, SYSTEM, AND METHO FOR TREATING SUBSTRATE
摘要 The present invention relates to a substrate treating apparatus. The substrate treating apparatus according to an embodiment of the present invention includes a housing having an opening through which a substrate enters or exits, a gas supply unit supplying a gas into the housing to increase a pressure inside the housing, a sensor unit measuring the pressure inside the housing, a door opening or closing the opening, a controller controlling driving of the door. The controller carries out a first substrate from the housing if the door is opened, and at the same time, sets a pressure measured by the sensor unit as a reference value. The controller controls the sensor unit to measure a pressure after a certain processing of a second substrate in the housing is completed, and compares the measurement with the reference value to determine whether to open the door.
申请公布号 KR20150116003(A) 申请公布日期 2015.10.15
申请号 KR20140039965 申请日期 2014.04.03
申请人 PSK INC. 发明人 PARK, JI HOON;IM, KUNG HWA
分类号 H01L21/02 主分类号 H01L21/02
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