发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To prevent malfunction of a logic circuit; or reduce power consumption.SOLUTION: A logic circuit has: thin film transistors 11-14, 21-24 in each of which a channel formation region is composed of an oxide semiconductor; and capacitative elements 15, 25 each of which has a terminal where potential becomes a floating state when the thin film transistors 14, 24 are turned off. The oxide semiconductor has a hydrogen concentration of 5×10(atoms/cm) and under and functions substantially as an insulator in a state where an electric field is not generated thereby to reduce off-state current of the thin film transistor. This inhibits leakage of charge accumulated in the capacitative element via the thin film transistor to prevent malfunction of the logic circuit. Further, wasted current which passes through the logic circuit is reduced. |
申请公布号 |
JP2015181167(A) |
申请公布日期 |
2015.10.15 |
申请号 |
JP20150082620 |
申请日期 |
2015.04.14 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;KOYAMA JUN;TSUBUKI MASASHI;NODA KOSEI |
分类号 |
H01L21/336;G02F1/1368;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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