发明名称 TRANSISTOR CIRCUIT
摘要 PROBLEM TO BE SOLVED: To form a thin film transistor having high voltage withstanding ability and a thin film transistor having a high current driving ability on an identical substrate.SOLUTION: In a first thin film transistor, a bottom gate electrode 20 is located below a semiconductor layer through a first gate insulation film 30 and a top gate layer 50 is provided at the side, which faces the bottom gate electrode across the semiconductor layer, through a second gate insulation film 31. In a second thin film transistor, only a bottom gate electrode 20 is provided below a semiconductor layer through a first gate insulation film 30. In a transistor circuit including a thin film transistor formed on an insulative substrate and comprising a semiconductor layer 40, a source region 41, and a drain region 42, the at least one first thin film transistor and the at least one second thin film transistor are formed on an identical substrate.
申请公布号 JP2015181194(A) 申请公布日期 2015.10.15
申请号 JP20150117055 申请日期 2015.06.09
申请人 NLT TECHNOLOGIES LTD 发明人 KORENARI TAKAHIRO;TANABE HIROSHI
分类号 H01L21/8234;H01L21/336;H01L27/08;H01L27/088;H01L29/786 主分类号 H01L21/8234
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