发明名称 UNIT TESTING OF DATA STORAGE DEVICES AT A DATA CENTER
摘要 A plurality of data storage devices from a storage device provider are received, at a data center. A tester is received at the data center via the storage device provider. A unit test of the data storage devices is performed at the data center via the tester contemporaneously with using the data storage devices in the data center.
申请公布号 US2015294735(A1) 申请公布日期 2015.10.15
申请号 US201414251054 申请日期 2014.04.11
申请人 Seagate Technology LLC 发明人 Gao Kaizhong;Aune Dave
分类号 G11C29/08;H04L29/08 主分类号 G11C29/08
代理机构 代理人
主权项 1. A method, comprising: receiving, at a data center, a plurality of data storage devices from a storage device provider; receiving, at the data center, a tester via the storage device provider; and performing a unit test of the data storage devices at the data center via the tester contemporaneously with using the data storage devices in the data center.
地址 Cupertino CA US