发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING AND PROCESSING METHODS AND APPARATUSES FOR FORMING A FILM |
摘要 |
A semiconductor device manufacturing method includes: accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. The forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber; maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, and exhausting an inside of the processing chamber. |
申请公布号 |
US2015294854(A1) |
申请公布日期 |
2015.10.15 |
申请号 |
US201514747631 |
申请日期 |
2015.06.23 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
TAKEDA Tsuyoshi;SATO Taketoshi |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device comprising:
accommodating a substrate in a processing chamber; and forming a film including silicon and carbon on the substrate by supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated, wherein the forming of the film including silicon and carbon includes:
supplying the silicon-based gas and the amine-based gas into the processing chamber and exhausting the silicon-based gas and the amine-based gas from the processing chamber, while a state in which an exhaust rate of the silicon-based gas and the amine-based gas from the processing chamber is lower than a supply rate of the silicon-based gas and the amine-based gas into the processing chamber is maintained; andstopping supplying the silicon-based gas and the amine-based gas into the processing chamber, and exhausting an inside of the processing chamber. |
地址 |
Tokyo JP |