发明名称 SEMICONDUCTOR DEVICE MANUFACTURING AND PROCESSING METHODS AND APPARATUSES FOR FORMING A FILM
摘要 A semiconductor device manufacturing method includes: accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. The forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber; maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, and exhausting an inside of the processing chamber.
申请公布号 US2015294854(A1) 申请公布日期 2015.10.15
申请号 US201514747631 申请日期 2015.06.23
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 TAKEDA Tsuyoshi;SATO Taketoshi
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device comprising: accommodating a substrate in a processing chamber; and forming a film including silicon and carbon on the substrate by supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated, wherein the forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and exhausting the silicon-based gas and the amine-based gas from the processing chamber, while a state in which an exhaust rate of the silicon-based gas and the amine-based gas from the processing chamber is lower than a supply rate of the silicon-based gas and the amine-based gas into the processing chamber is maintained; andstopping supplying the silicon-based gas and the amine-based gas into the processing chamber, and exhausting an inside of the processing chamber.
地址 Tokyo JP