发明名称 |
TEST DEVICE OF GATE DRIVER AND OPERATION METHOD FOR THEREOF |
摘要 |
A test device of a gate driver according to an embodiment of the present invention includes: a display panel where a plurality of gate lines and a plurality of data lines are arranged as crossing each other; the gate driver which outputs a plurality of gate signals to the gate lines in sequence; a plurality of parasitic capacitors which is formed in an area where the gate lines and the data lines cross each other, and charges a parasitic voltage corresponding the gate signals; and a measurement instrument which receives the parasitic voltages through the data lines, and detects whether the gate lines are normal or not on the basis of the parasitic voltages. |
申请公布号 |
KR20150116069(A) |
申请公布日期 |
2015.10.15 |
申请号 |
KR20140040388 |
申请日期 |
2014.04.04 |
申请人 |
SAMSUNG DISPLAY CO., LTD. |
发明人 |
KIM, NAM HYOUNG;MIMURA HIDEKI |
分类号 |
G01R31/28;G09G3/30 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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