发明名称 TEST DEVICE OF GATE DRIVER AND OPERATION METHOD FOR THEREOF
摘要 A test device of a gate driver according to an embodiment of the present invention includes: a display panel where a plurality of gate lines and a plurality of data lines are arranged as crossing each other; the gate driver which outputs a plurality of gate signals to the gate lines in sequence; a plurality of parasitic capacitors which is formed in an area where the gate lines and the data lines cross each other, and charges a parasitic voltage corresponding the gate signals; and a measurement instrument which receives the parasitic voltages through the data lines, and detects whether the gate lines are normal or not on the basis of the parasitic voltages.
申请公布号 KR20150116069(A) 申请公布日期 2015.10.15
申请号 KR20140040388 申请日期 2014.04.04
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 KIM, NAM HYOUNG;MIMURA HIDEKI
分类号 G01R31/28;G09G3/30 主分类号 G01R31/28
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