| 摘要 |
The present invention relates to a device and a method for classifying defects of each layer of a transparent object with multiple layers and, more specifically, to a device and a method for classifying defects of each layer of a transparent object with multiple layers capable of grasping major processes causing defects and improving the processes by detecting defects of the transparent object, that is, a panel and even layers where the defects exist, improving the productivity of the panel by determining a disposal of the panel according to the positions of the defects, reducing expenses by recycling materials, and preventing inspection errors due to dust on a panel surface by acquiring images relatively less sensitive to dust on the panel surface. According to the present invention, provided is the device for classifying defects of each layer of the transparent object with the multiple layers including a light vertically emitting unit emitting lights to the panel surface; a first camera arranged perpendicular to the panel surface and taking images or videos of the panel surface; a second camera arranged to be inclined to the panel surface and taking images or videos of the panel surface; and a control unit grasping defects inside the panel based on the images or videos taken by the first and second cameras and defecting the positions of the defects using a specific point preset to be positioned at a specific part of the panel and a reference point arranged perpendicular to the defects at a height different from the defects when the defects exist. |
