发明名称 TEST PROBE, TESTING SYSTEM, AND TESTING METHOD
摘要 The probe is provided with: an excitation direction control means (125) for controlling the excitation direction, using a magnetizer (111) which has two or more excitation coils (111a-111d), and in which the legs facing towards a body under inspection (300) are positioned at equidistant intervals on a circle; a magnetooptical thin film sensor (112) positioned in an area to the inside of the circle where the legs of the magnetizer (111) are positioned; and a magnetic field image acquisition means (121) for acquiring magnetic field image data, using the magnetooptical thin film sensor (112). In so doing, decline in detection sensitivity can be minimized, regardless of the shape of an imperfection, or the thickness of the excitation coils.
申请公布号 WO2015155877(A1) 申请公布日期 2015.10.15
申请号 WO2014JP60445 申请日期 2014.04.10
申请人 HITACHI, LTD. 发明人 ENDOU HISASHI
分类号 G01N27/83;G01B11/30;G01R33/032 主分类号 G01N27/83
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