发明名称 |
SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, MODULE AND ELECTRONIC APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a novel semiconductor device using an oxide semiconductor; and especially provide a planar semiconductor device using an oxide semiconductor.SOLUTION: A semiconductor device has a transistor and a capacitative element. The transistor includes: a first conductive film; a first insulation film having a hydrogen-containing film; a second insulation film including an oxide insulation film; an oxide semiconductor film having a first region overlapping the first conductive film with each other and a pair of second regions sandwiching the first region; a pair of electrodes; a gate insulation film; and a second conductive film. The capacitative element has a lower electrode; an inter-electrode insulation film and an upper electrode. The lower electrode includes a material the same with a material included in the first conductive film. The inter-electrode insulation film has a third insulation film including a material the same with a material included in the first insulation film, and a fourth insulation film including a material the same with a material included in the gate insulation film. The upper electrode includes a material the same with a material included in the second conductive film and has a hydrogen-containing fifth insulation film on the transistor.</p> |
申请公布号 |
JP2015181150(A) |
申请公布日期 |
2015.10.15 |
申请号 |
JP20150019214 |
申请日期 |
2015.02.03 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;OKAZAKI KENICHI;NAKATA MASATAKA;KATAYAMA MASAHIRO |
分类号 |
H01L29/786;C23C16/42;G02F1/1368;G09F9/30;H01L21/316;H01L21/318;H01L21/336;H01L21/428;H01L21/471;H01L21/473;H01L21/477 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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