发明名称 テストパターン生成装置,テストパターン生成方法およびテストパターン生成プログラム
摘要 <p>A second computing device determines whether or not a conflict occurs wherein at least two of a plurality of first computing devices set different request values to an input point to which a request value is to be set, based on the request value stored in the request value buffer. When it is determined by the second computing device that a conflict occurs wherein one of the plurality of first computing devices is about to set a request value different from a request value that is set to that input point by another first computing device, the one of the first computing devices stops setting the request value. This prevents any increase in the test pattern count due to parallel processing.</p>
申请公布号 JP5794027(B2) 申请公布日期 2015.10.14
申请号 JP20110169010 申请日期 2011.08.02
申请人 发明人
分类号 G01R31/3183;G06F17/50 主分类号 G01R31/3183
代理机构 代理人
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