Sample holding micro vice and sample holding system for coupled transmission electron microscopy (TEM) and atom-probe tomography (APT) analyses

摘要

The present disclosure relates to a sample holding micro vice and a sample holding system for coupled transmission electron microscopy (TEM) and atom-probe tomography (APT) analyses. The sample holding micro vice (3) configured to support a tomographic TEM grid (2) intended to receive a sample (6), comprises a base (301) and a clamp. The base (301) comprises a mounting rod (302) configured to engage the sample holding micro vice (3) into the APT device; a base plate (314) fixed perpendicularly to the mounting rod (302); a flat part (303) disposed perpendicularly to the base plate (314) and on the base plate, said flat part (303) comprising a socket (306) having a shape complementary to the tomographic TEM grid (2) to receive the tomographic TEM grid (2) wherein the socket has a depth equal or less than the thickness of the tomographic TEM grid. The clamp (304) has a flat face (308) adapted to maintain the tomographic TEM grid (2) in the socket (306).