发明名称 |
Dose-based end-pointing for low-kv FIB milling in TEM sample preparation |
摘要 |
<p>A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae (104) using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer (402) to produce the finished sample lamella (304) including at least a portion of the feature of interest.</p> |
申请公布号 |
EP2704179(A3) |
申请公布日期 |
2015.10.14 |
申请号 |
EP20130182112 |
申请日期 |
2013.08.29 |
申请人 |
FEI COMPANY |
发明人 |
MILLER, TOM;ARJAVAC, JASON;MORIARTY, MICHAEL |
分类号 |
H01J37/304;G01N1/32;H01J37/302;H01J37/305 |
主分类号 |
H01J37/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|