Enhanced debugging for embedded devices

摘要

Methods, machine-readable tangible storage media, and data processing systems that enable a debug host device to acquire memory dump information from a debug target device after the target device suffers an unrecoverable system malfunction are disclosed. In one embodiment, data in the volatile memory on a debug target device is accessed via a hardware integrated debug framework, which is also used to access data on a nonvolatile electronically erasable semiconductor memory of a debug target device, and one or more registers of one or more processors on a debug target device, and a core dump is created on the debug host device.

主权项

1. A machine implemented method at a debug host device, the method comprising:
accessing, via a hardware integrated debug framework, data in volatile random access memory of a debug target device; accessing, via the hardware integrated debug framework, data in a nonvolatile random access electrically erasable semiconductor memory device of the debug target device via a device translation layer for the semiconductor memory device; accessing, via the hardware integrated debug framework, one or more registers of one or more processors on the debug target device; and creating, on the debug host device, a debug target system snapshot comprising the volatile memory data, nonvolatile memory data, and data from one or more registers of one or more processors on the debug target device, wherein the debug target device has malfunctioned due to a failure.