发明名称 Tungsten deposition process using germanium-containing reducing agent
摘要 Methods for depositing low resistivity tungsten in features of substrates in semiconductor processing are disclosed herein. Methods involve using a germanium-containing reducing agent during tungsten nucleation layer deposition to achieve thin, low resistivity nucleation layers.
申请公布号 US9159571(B2) 申请公布日期 2015.10.13
申请号 US201414173733 申请日期 2014.02.05
申请人 Lam Research Corporation 发明人 Humayun Raashina;Manandhar Sudha;Danek Michal
分类号 H01L21/20;H01L21/285;H01L21/67;H01L21/768;C23C16/02;C23C16/04;C23C16/14;C23C16/455 主分类号 H01L21/20
代理机构 Weaver Austin Villenuve & Sampson LLP 代理人 Weaver Austin Villenuve & Sampson LLP
主权项 1. A method of filling a feature on a substrate with tungsten, the method comprising: prior to depositing a bulk tungsten layer, forming a tungsten nucleation layer by exposing the feature to alternating pulses of a germanium-containing reducing agent and a tungsten-containing precursor.
地址 Fremont CA US