Sample carrier for an electron microscope

摘要

The invention relates to a sample carrier for a transmission electron microscope. When using state of the art sample carriers, such as half-moon grids in combination with detectors detecting, for example, X-rays emitted at a large emittance angle, shadowing is a problem. Similar problems occur when performing tomography, in which the sample is rotated over a large angle.;The invention provides a solution to shadowing by forming the parts of the grid bordering the interface between sample and grid as tapering parts.

主权项

1. A sample carrier for carrying a sample in an electron microscope, the sample carrier comprising a metal foil, the sample carrier comprising at least one mounting position on a lateral side of a tapered portion of the metal foil for attaching a sample thereto, wherein the at least one mounting position borders a part of the sample carrier in which a thickness of the metal foil is reduced, wherein the part comprises the tapered portion, and wherein the lateral side of the metal foil is substantially not parallel to a flat of the sample carrier.