发明名称 |
Method of programming a nonvolatile memory device |
摘要 |
In method of programming a nonvolatile memory device including first and second cell strings that are coupled to one bitline, a first channel of the first cell string and a second channel of the second cell string are precharged by applying a first voltage to the bitline, one cell string is selected from the first and second cell strings, and a memory cell included in the selected cell string is programmed by applying a second voltage greater than a ground voltage and less than the first voltage to the bitline. |
申请公布号 |
US9159432(B2) |
申请公布日期 |
2015.10.13 |
申请号 |
US201313790409 |
申请日期 |
2013.03.08 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Chang-Hyun;Kang Jee-Yeon;Jang Dong-Hoon;Choi Jung-Dal |
分类号 |
G11C16/24;G11C16/04;G11C16/10 |
主分类号 |
G11C16/24 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of programming a nonvolatile memory device including first and second cell strings that are coupled to one bitline, the method comprising:
precharging a first channel of the first cell string and a second channel of the second cell string by applying a first voltage to the bitline; selecting one cell string from the first and second cell strings; and programming a memory cell included in the selected cell string by applying to the bitline a second voltage greater than a ground voltage and less than the first voltage, wherein the first channel of the first cell string and the second channel of the second cell string are precharged to a precharge voltage level, and wherein, when the memory cell included in the selected cell string is programmed, a voltage of a channel of the selected cell string decreases to a voltage level that is less than the precharge voltage level, and a voltage of a channel of an unselected cell string increases to a boosted voltage level greater than the precharge voltage level. |
地址 |
Suwon-si, Gyeonggi-do KR |