发明名称 FinFET and fabricating method thereof
摘要 A fin-shaped field-effect transistor process includes the following steps. A substrate is provided. A first fin-shaped field-effect transistor and a second fin-shaped field-effect transistor are formed on the substrate, wherein the first fin-shaped field-effect transistor includes a first metal layer and the second fin-shaped field-effect transistor includes a second metal layer. A treatment process is performed on the first fin-shaped field-effect transistor to adjust the threshold voltage of the first fin-shaped field-effect transistor. A fin-shaped field-effect transistor formed by said process is also provided.
申请公布号 US9159626(B2) 申请公布日期 2015.10.13
申请号 US201213418367 申请日期 2012.03.13
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Chien-Ting;Chiang Wen-Tai
分类号 H01L27/088;H01L21/326;H01L21/8234;H01L21/8238;H01L21/28;H01L29/51;H01L29/66 主分类号 H01L27/088
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A field-effect transistor, comprising: a first fin-shaped field-effect transistor and a second fin-shaped field-effect transistor with the same conductivity type located on a substrate, wherein the first fin-shaped field-effect transistor comprises a buffer layer, a dielectric layer, a bottom barrier layer and a first work function layer all having U-shaped cross-sectional profiles stacked on each other and the second fin-shaped field-effect transistor comprises a buffer layer, a dielectric layer, a bottom barrier layer and a second work function layer all having U-shaped cross-sectional profiles stacked on each other, and the first work function layer and the second work function layer are of the same material but are of different thicknesses.
地址 Science-Based Industrial Park, Hsin-Chu TW