发明名称 |
FinFET and fabricating method thereof |
摘要 |
A fin-shaped field-effect transistor process includes the following steps. A substrate is provided. A first fin-shaped field-effect transistor and a second fin-shaped field-effect transistor are formed on the substrate, wherein the first fin-shaped field-effect transistor includes a first metal layer and the second fin-shaped field-effect transistor includes a second metal layer. A treatment process is performed on the first fin-shaped field-effect transistor to adjust the threshold voltage of the first fin-shaped field-effect transistor. A fin-shaped field-effect transistor formed by said process is also provided. |
申请公布号 |
US9159626(B2) |
申请公布日期 |
2015.10.13 |
申请号 |
US201213418367 |
申请日期 |
2012.03.13 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Lin Chien-Ting;Chiang Wen-Tai |
分类号 |
H01L27/088;H01L21/326;H01L21/8234;H01L21/8238;H01L21/28;H01L29/51;H01L29/66 |
主分类号 |
H01L27/088 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A field-effect transistor, comprising:
a first fin-shaped field-effect transistor and a second fin-shaped field-effect transistor with the same conductivity type located on a substrate, wherein the first fin-shaped field-effect transistor comprises a buffer layer, a dielectric layer, a bottom barrier layer and a first work function layer all having U-shaped cross-sectional profiles stacked on each other and the second fin-shaped field-effect transistor comprises a buffer layer, a dielectric layer, a bottom barrier layer and a second work function layer all having U-shaped cross-sectional profiles stacked on each other, and the first work function layer and the second work function layer are of the same material but are of different thicknesses. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |