发明名称 Polishing composition
摘要 A polishing composition contains colloidal silica. The colloidal silica satisfies the expression A×D×E×F≧350,000 where “A” denotes the average aspect ratio (dimensionless) of the colloidal silica, “D” denotes the average particle diameter (units: nm) of the colloidal silica, “E” denotes the standard deviation of the particle size (units: nm) of the colloidal silica, and “F” denotes the volume fraction (units: %) of particles having a diameter of 1 to 300 nm in the colloidal silica. The volume fraction of particles having a diameter of 1 to 300 nm in the colloidal silica is 90% or greater.
申请公布号 US9157011(B2) 申请公布日期 2015.10.13
申请号 US201113818554 申请日期 2011.08.25
申请人 FUJIMI INCORPORATED 发明人 Ashitaka Keiji;Morinaga Hitoshi;Tahara Muneaki
分类号 C09G1/00;C09G1/02;C09K3/14;H01L21/02;H01L21/3105;B24D3/02;C09C1/68 主分类号 C09G1/00
代理机构 Foley & Lardner LLP 代理人 Foley & Lardner LLP
主权项 1. A polishing composition comprising colloidal silica, wherein when “A” denotes an average aspect ratio (dimensionless) of the colloidal silica; “D” denotes an average particle diameter (units: nm) of the colloidal silica; “E” denotes a standard deviation of the particle diameter (units: nm) of the colloidal silica; and “F” denotes a volume fraction (units: %) of particles having a diameter of 1 to 300 nm in the colloidal silica, a value obtained by the expression A×D×E×F is 350.000 or greater, the volume fraction of particles having a diameter of 1 to 300 nm in the colloidal silica is 90% or greater, the volume fraction of particles having a diameter of 50 nm or greater and an aspect ratio of 1.2 or greater in the colloidal silica is 50% or greater, the standard deviation of the particle diameter of the colloidal silica is 34.2 nm or more.
地址 Kiyosu-shi JP
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