发明名称 Method of fabricating semiconductor device
摘要 A method for fabricating a semiconductor device includes forming a metal layer over a substrate, forming a capping layer over the metal layer, and densifying the metal layer through a heat treatment.
申请公布号 US9159779(B2) 申请公布日期 2015.10.13
申请号 US201213617305 申请日期 2012.09.14
申请人 SK Hynix Inc. 发明人 Kim Beom-Yong;Ji Yun-Hyuck;Lee Seung-Mi
分类号 H01L21/28;H01L21/768;H01L49/02;H01L29/66;H01L29/94 主分类号 H01L21/28
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method for fabricating a capacitor, comprising: forming a lower electrode; forming a dielectric layer over the lower electrode; forming an upper electrode metal layer over the dielectric layer; forming an upper electrode capping layer over the upper electrode metal layer; densifying the upper electrode metal layer through a first heat treatment; removing all of the upper electrode capping layer; and forming an upper electrode by etching the upper electrode metal layer after all of the upper electrode capping layer is removed, wherein the forming of the lower electrode comprises: forming a lower electrode metal layer;forming a lower electrode capping layer over the lower electrode metal layer;densifying the lower electrode metal layer through a second heat treatment;removing all of the lower electrode capping layer; andforming the lower electrode by etching the lower electrode metal layer after all of the lower electrode capping layer is removed.
地址 Gyeonggi-do KR