发明名称 |
Method of fabricating semiconductor device |
摘要 |
A method for fabricating a semiconductor device includes forming a metal layer over a substrate, forming a capping layer over the metal layer, and densifying the metal layer through a heat treatment. |
申请公布号 |
US9159779(B2) |
申请公布日期 |
2015.10.13 |
申请号 |
US201213617305 |
申请日期 |
2012.09.14 |
申请人 |
SK Hynix Inc. |
发明人 |
Kim Beom-Yong;Ji Yun-Hyuck;Lee Seung-Mi |
分类号 |
H01L21/28;H01L21/768;H01L49/02;H01L29/66;H01L29/94 |
主分类号 |
H01L21/28 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A method for fabricating a capacitor, comprising:
forming a lower electrode; forming a dielectric layer over the lower electrode; forming an upper electrode metal layer over the dielectric layer; forming an upper electrode capping layer over the upper electrode metal layer; densifying the upper electrode metal layer through a first heat treatment; removing all of the upper electrode capping layer; and forming an upper electrode by etching the upper electrode metal layer after all of the upper electrode capping layer is removed, wherein the forming of the lower electrode comprises:
forming a lower electrode metal layer;forming a lower electrode capping layer over the lower electrode metal layer;densifying the lower electrode metal layer through a second heat treatment;removing all of the lower electrode capping layer; andforming the lower electrode by etching the lower electrode metal layer after all of the lower electrode capping layer is removed. |
地址 |
Gyeonggi-do KR |