发明名称 Semiconductor device with buried gate and method for fabricating the same
摘要 A method for fabricating a semiconductor device includes forming landing plugs over a substrate, forming a trench by etching the substrate between the landing plugs, forming a buried gate to partially fill the trench, forming a gap-fill layer to gap-fill an upper side of the buried gate, forming protruding portions of the landing plugs, and trimming the protruding portions of the landing plugs.
申请公布号 US9159732(B2) 申请公布日期 2015.10.13
申请号 US201213553307 申请日期 2012.07.19
申请人 Hynix Semiconductor Inc. 发明人 Shin Jong-Han;Park Jum-Yong
分类号 H01L29/66;H01L27/108;H01L29/423 主分类号 H01L29/66
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device comprising: a substrate having a trench arranged therein; a buried gate partially filling the trench; a first gap-fill layer arranged over the buried gate and protruding from a surface of the substrate; a landing plug having a buried portion arranged over the substrate between the first gap-fill layer and a protruding portion arranged over the buried portion; a second gap-fill layer formed over the first gap-fill layer; and a spacer formed between the first gap-fill layer and the second gap-fill layer and surrounding sidewalls and a bottom surface of the second gap-fill layer, wherein an upper surface of the buried gate is lower than a bottom surface of the landing plug, and wherein the protruding portion of the landing plug has a smaller area than the buried portion of the landing plug.
地址 Gyeonggi-do KR