发明名称 Testing circuits of liquid crystal display and the testing method thereof
摘要 A device and method for testing a display panel are disclosed. The display panel includes a plurality of pixels arranged in a matrix. Each of the pixels is controlled by a charging gate line and a sharing gate line. The testing circuit includes a first, second, third data testing pad electrically coupling a plurality of red, green, and blue sub-pixels respectively, and k gate testing pad. The sharing gate line of m-th sub-pixel row electrically connects to the charging gate line of (m+2n)-th sub-pixel row, wherein m is a positive integer, and n is the positive integer not less than 2. A row number of the sub-pixel row is divided by k to obtain a remainder q. The q-th gate testing pad electrically connects to the charging gate lines coupled with the sub-pixel row, and k and q are positive integers. And 2n is not divisible by k.
申请公布号 US9159259(B2) 申请公布日期 2015.10.13
申请号 US201313981350 申请日期 2013.06.24
申请人 Shenzhen China Star Optoelectronics Technology Co., Ltd 发明人 Xu Liang
分类号 G09G3/00;G09G3/36 主分类号 G09G3/00
代理机构 代理人 Cheng Andrew C.
主权项 1. A testing circuit of a display panel, the display panel comprises a plurality of pixels arranged in a matrix comprising sub-pixel rows and sub-pixel columns, each of the pixels is controlled by a charging gate line and a sharing gate line, comprising: a first data testing pad electrically coupling a plurality of red sub-pixels; a second data testing pad electrically coupling a plurality of green sub-pixels; a third data testing pad electrically coupling a plurality of black sub-pixels; the sharing gate line of m-th sub-pixel row electrically connects to the charging gate line of (m+2n)-th sub-pixel row, and wherein m is a positive integer, and n is the positive integer not less than 2; k gate testing pads, wherein a row number of the sub-pixel row is divided by k to obtain a remainder q, the q-th gate testing pad electrically connects to the charging gate lines coupled with the sub-pixel row, and k and q are positive integers; and wherein 2n is not divisible by k.
地址 Shenzhen, Guangdong CN