发明名称 Nonvolatile memory device, operating method thereof and memory system including the same
摘要 A method of operating a non-volatile memory device includes performing an erasing operation to memory cells associated with a plurality of string selection lines (SSLs), the memory cells associated with the plurality of SSLs constituting a memory block, and verifying the erasing operation to second memory cells associated with a second SSL after verifying the erasing operation to first memory cells associated with a first SSL.
申请公布号 US9159443(B2) 申请公布日期 2015.10.13
申请号 US201314052227 申请日期 2013.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Yoon Chi Weon;Chae Donghyuk;Park Jae-Woo;Nam Sang-Wan
分类号 G11C11/34;G11C16/34;G11C16/04;G11C16/06;G11C16/16 主分类号 G11C11/34
代理机构 F. Chau & Associates, LLP 代理人 F. Chau & Associates, LLP
主权项 1. A method of operating a non-volatile memory device including a plurality of cell strings connected to a bit line, each cell string having at least one ground selection transistor, a plurality of memory cells and at least one string selection transistor stacked sequentially from a substrate in a direction perpendicular to the substrate, ground selection transistors of the plurality of cell strings being connected to a ground selection line in common, string selection transistors of the plurality of cell strings being connected to a plurality of string selection lines respectively, and memory cells having the same height from the substrate being connected to a word line in common, the method comprising: performing an erasing operation to memory cells of the plurality of cell strings; verifying first memory cells associated with a first string selection line of the plurality of string selection lines; and verifying second memory cells associated with a second string selection line of the plurality of string selection lines subsequent to verifying the first memory cells.
地址 Suwon-Si, Gyeonggi-Do KR
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