发明名称 |
Nonvolatile memory device, operating method thereof and memory system including the same |
摘要 |
A method of operating a non-volatile memory device includes performing an erasing operation to memory cells associated with a plurality of string selection lines (SSLs), the memory cells associated with the plurality of SSLs constituting a memory block, and verifying the erasing operation to second memory cells associated with a second SSL after verifying the erasing operation to first memory cells associated with a first SSL. |
申请公布号 |
US9159443(B2) |
申请公布日期 |
2015.10.13 |
申请号 |
US201314052227 |
申请日期 |
2013.10.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Yoon Chi Weon;Chae Donghyuk;Park Jae-Woo;Nam Sang-Wan |
分类号 |
G11C11/34;G11C16/34;G11C16/04;G11C16/06;G11C16/16 |
主分类号 |
G11C11/34 |
代理机构 |
F. Chau & Associates, LLP |
代理人 |
F. Chau & Associates, LLP |
主权项 |
1. A method of operating a non-volatile memory device including a plurality of cell strings connected to a bit line, each cell string having at least one ground selection transistor, a plurality of memory cells and at least one string selection transistor stacked sequentially from a substrate in a direction perpendicular to the substrate, ground selection transistors of the plurality of cell strings being connected to a ground selection line in common, string selection transistors of the plurality of cell strings being connected to a plurality of string selection lines respectively, and memory cells having the same height from the substrate being connected to a word line in common, the method comprising:
performing an erasing operation to memory cells of the plurality of cell strings; verifying first memory cells associated with a first string selection line of the plurality of string selection lines; and verifying second memory cells associated with a second string selection line of the plurality of string selection lines subsequent to verifying the first memory cells. |
地址 |
Suwon-Si, Gyeonggi-Do KR |