发明名称 SEMICONDUCTOR WAFER
摘要 (Subject) Provided is a semiconductor wafer for easily identifying different kinds of semiconductor chips of the same chip size wherein many kinds of semiconductor chips are attached onto a surface of the semiconductor wafer. (Solution) An exceptional area(7) is formed on an outer circumference of the semiconductor wafer. The inside of the semiconductor wafer is divided into A, B, C, and D which have different kinds. A, B, C, and D, semiconductor chip areas, are divided by boundaries(22, 23, 24). Mark chips(1, 2, 3, 4) are arranged around both ends of boundaries(21, 22, 23, 24).
申请公布号 KR20150114423(A) 申请公布日期 2015.10.12
申请号 KR20150044262 申请日期 2015.03.30
申请人 SEIKO INSTRU KABUSHIKI KAISHA, ALSO TRADING AS SEIKO INSTRUMENTS INC. 发明人 MATSUMOTO YASUNOBU;SUZUKI MASAKI;ASOU MAKOTO;MORITA HIROSHI
分类号 H01L21/66;H01L23/544 主分类号 H01L21/66
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