发明名称 DIAGNOSTIC MODEL GENERATION APPARATUS, DIAGNOSTIC MODEL GENERATION METHOD, AND ABNORMALITY DIAGNOSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To perform diagnostic model generation and abnormality diagnosis capable of easily generating a physical model.SOLUTION: Parameter values of value-undetermined parameters in a first physical model are calculated on the basis of the first physical model and measurement values, the first physical model representing a relation among a plurality of variables on the basis of the variables to each of which a measurement value is assigned and the value-undetermined parameters; a first residual of the first physical model is calculated on the basis of the first physical model, the parameter values, and the measurement values; it is determined whether the first physical model can be adopted on the basis of the first residual; a second residual of the first model is calculated on the basis of the first physical model, the measurement values, and the parameter values if the first physical model is not adopted; a measurement value correlating with the second residual is searched from measurement values that are not assigned to the variables; and a second physical model representing the relation among the variables is generated on the basis of the variable to which the searched measurement value is assigned, the variables of the first physical model, and newly set, value-undetermined parameters.
申请公布号 JP2015179443(A) 申请公布日期 2015.10.08
申请号 JP20140057027 申请日期 2014.03.19
申请人 TOSHIBA CORP 发明人 HATANO TOSHIAKI;AISU HIDEYUKI;FUJIWARA KENICHI
分类号 G05B23/02 主分类号 G05B23/02
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