| 发明名称 |
METHOD OF TESTING SEMICONDUCTOR MEMORY DEVICE, TEST DEVICE, AND COMPUTER READABLE RECORDING MEDIUM FOR RECORDING TEST PROGRAM FOR SEMICONDUCTOR MEMORY DEVICE |
| 摘要 |
A method of testing a semiconductor memory device is provided. The method includes performing a test according to a plurality of cases corresponding to a first generation and generating modeled test results for the plurality of cases, determining optimum cases from among the plurality of cases based on the modeled test results, and generating a plurality of cases corresponding to a second generation based on the optimum cases. |
| 申请公布号 |
US2015287476(A1) |
申请公布日期 |
2015.10.08 |
| 申请号 |
US201514676395 |
申请日期 |
2015.04.01 |
| 申请人 |
PARK Sea Eun;YUN Sung Hee |
发明人 |
PARK Sea Eun;YUN Sung Hee |
| 分类号 |
G11C29/36;G11C29/44 |
主分类号 |
G11C29/36 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of testing a semiconductor memory device, the method comprising:
performing a test on the semiconductor memory device according to a plurality of cases corresponding to a first generation and generating modeled test results for the plurality of cases; determining optimum cases from among the plurality of cases based on the modeled test results; and generating a plurality of cases corresponding to a second generation based on the optimum cases. |
| 地址 |
Hwaseong-si KR |
