发明名称 METHOD OF FABRICATING NITRIDE FILM
摘要 The present invention relates to a method for manufacturing a nitride film, capable of easily adjusting compression stress while the quality of a film is stably maintained by using an atomic layer deposition method. The method for manufacturing a nitride film by an atomic layer deposition method is to perform a unit cycle at least one time. The unit cycle includes a step of providing post-processing gas having nitrogen gas (N_2) onto a unit deposition film after the unit deposition film is formed in response to source gas adsorbed onto a substrate and response gas having a nitrogen component (N) and a hydrogen component (H).
申请公布号 KR20150113578(A) 申请公布日期 2015.10.08
申请号 KR20140037725 申请日期 2014.03.31
申请人 WONIK IPS CO., LTD. 发明人 JANG, JUN SEOK;LEE, KYUNG EUN;RYU, DONG HO;CHO, BYUNG CHUL;PARK, JU HWAN;LA, DOO HYUN
分类号 H01L21/318;H01L21/205 主分类号 H01L21/318
代理机构 代理人
主权项
地址