The present invention relates to a method for manufacturing a nitride film, capable of easily adjusting compression stress while the quality of a film is stably maintained by using an atomic layer deposition method. The method for manufacturing a nitride film by an atomic layer deposition method is to perform a unit cycle at least one time. The unit cycle includes a step of providing post-processing gas having nitrogen gas (N_2) onto a unit deposition film after the unit deposition film is formed in response to source gas adsorbed onto a substrate and response gas having a nitrogen component (N) and a hydrogen component (H).
申请公布号
KR20150113578(A)
申请公布日期
2015.10.08
申请号
KR20140037725
申请日期
2014.03.31
申请人
WONIK IPS CO., LTD.
发明人
JANG, JUN SEOK;LEE, KYUNG EUN;RYU, DONG HO;CHO, BYUNG CHUL;PARK, JU HWAN;LA, DOO HYUN