发明名称 MEASUREMENT STATE STORAGE DEVICE, MEASUREMENT STATE STORAGE METHOD AND PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide a measurement state storage device, a measurement state storage method and a program capable of specifying the factor of an abnormality shown by an inspection result without changing the specification of a device for outputting a control signal and confirming the procedure of the inspection.SOLUTION: A measurement state storage device includes: a communication section for receiving a first control signal, a second control signal and a measurement result signal showing a measurement result of a measurement section from an insection device including a measurement section for measuring the state of an article to be an inspection object and a control section for outputting the first control signal for controlling the state of the article to the article and outputting the second control signal for controlling the operation of the measurement section to the measurement section; and a recording section for recording each of the first control signal, the second control signal and the measurement result signal by associating each signal with time information according to the reception time of each signal in the communication section.</p>
申请公布号 JP2015178997(A) 申请公布日期 2015.10.08
申请号 JP20140056076 申请日期 2014.03.19
申请人 NEC SAITAMA LTD 发明人 FUKUSHIMA NAOYUKI
分类号 G01R31/00 主分类号 G01R31/00
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