发明名称 Device Having Sloped Gate Profile and Method of Manufacture
摘要 A semiconductor device having an open profile gate electrode, and a method of manufacture, are provided. A funnel-shaped opening is formed in a dielectric layer and a gate electrode is formed in the funnel-shaped opening, thereby providing a gate electrode having an open profile. In some embodiments, first and second gate spacers are formed alongside a dummy gate electrode. The dummy gate electrode is removed and upper portions of the first and second gate spacers are removed. The first and second gate spacers may be formed of different materials having different etch rates.
申请公布号 US2015287798(A1) 申请公布日期 2015.10.08
申请号 US201414245795 申请日期 2014.04.04
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hsiao Ru-Shang;Wang Ling-Sung;Huang Chih-Mu;Chen Yao-Tsung;Tsai Ming-Tsang;Chen Kuan-Yu
分类号 H01L29/423;H01L29/40;H01L29/51;H01L29/78;H01L29/66 主分类号 H01L29/423
代理机构 代理人
主权项 1. A method of forming a semiconductor device, the method comprising: providing a substrate; forming a gate stack and gate spacers adjacent the gate stack; forming a first dielectric layer over the substrate adjacent the gate spacers; removing the gate stack and upper portions of the gate spacers, thereby forming a funnel-shaped opening; and forming a gate electrode in the funnel-shaped opening.
地址 Hsin-Chu TW