发明名称 DEVICES AND METHODS OF FORMING FINS AT TIGHT FIN PITCHES
摘要 Devices and methods for forming semiconductor devices with fins at tight fin pitches are provided. One method includes, for instance: obtaining an intermediate semiconductor device; growing an epi layer over the substrate; forming a doped layer below the epi layer; depositing a first oxide layer on the epi layer; applying a dielectric material on the first oxide layer; and depositing a lithography stack on the dielectric material. One intermediate semiconductor device includes, for instance: a substrate with at least one n-well region and at least one p-well region; a doped layer over the substrate; an epi layer over the doped layer; a first oxide layer over the epi layer; a dielectric layer over the first oxide layer; and a lithography stack over the dielectric layer.
申请公布号 US2015287595(A1) 申请公布日期 2015.10.08
申请号 US201514725430 申请日期 2015.05.29
申请人 GLOBALFOUNDRIES Inc. 发明人 WEI Andy;HARIHARAPUTHIRAN Mariappan;YANG Dae Geun;CHOI Dae-Han;HU Xiang;CARTER Richard J.;SEHGAL Akshey
分类号 H01L21/033;H01L29/78;H01L21/027 主分类号 H01L21/033
代理机构 代理人
主权项 1. An intermediate semiconductor device comprising: a substrate with at least one n-well region and at least one p-well region; a doped layer over the substrate; an epi layer over the doped layer; a first oxide layer over the epi layer; a dielectric layer over the first oxide layer; and a lithography stack over the dielectric layer.
地址 Grand Cayman KY