发明名称 |
METHOD FOR FORMING SILICON OXIDE FILM, AND DEVICE FOR FORMING SILICON OXIDE FILM |
摘要 |
PROBLEM TO BE SOLVED: To provide: a method for forming a silicon oxide film which enables the suppression of occurrence of a void or seam; and a device for forming a silicon oxide film.SOLUTION: A method for forming a silicon oxide film comprises: a silicon film formation step of forming a silicon film 55 in a groove 53 of a semiconductor wafer W; an etching step of etching the silicon film 55; an oxidation step of oxidizing the etched silicon film 55, thereby forming a silicon oxide film; and a filling step of forming a silicon oxide film so that it covers the silicon oxide film formed in the oxidation step and fills the groove 53 of the semiconductor wafer. |
申请公布号 |
JP2015179729(A) |
申请公布日期 |
2015.10.08 |
申请号 |
JP20140056207 |
申请日期 |
2014.03.19 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
OKADA MITSUHIRO |
分类号 |
H01L21/316;C23C16/42;H01L21/3065;H01L21/31;H01L21/76;H01L21/768;H01L23/522 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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