发明名称 METHOD FOR FORMING SILICON OXIDE FILM, AND DEVICE FOR FORMING SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide: a method for forming a silicon oxide film which enables the suppression of occurrence of a void or seam; and a device for forming a silicon oxide film.SOLUTION: A method for forming a silicon oxide film comprises: a silicon film formation step of forming a silicon film 55 in a groove 53 of a semiconductor wafer W; an etching step of etching the silicon film 55; an oxidation step of oxidizing the etched silicon film 55, thereby forming a silicon oxide film; and a filling step of forming a silicon oxide film so that it covers the silicon oxide film formed in the oxidation step and fills the groove 53 of the semiconductor wafer.
申请公布号 JP2015179729(A) 申请公布日期 2015.10.08
申请号 JP20140056207 申请日期 2014.03.19
申请人 TOKYO ELECTRON LTD 发明人 OKADA MITSUHIRO
分类号 H01L21/316;C23C16/42;H01L21/3065;H01L21/31;H01L21/76;H01L21/768;H01L23/522 主分类号 H01L21/316
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