发明名称 |
Bandgap Reference Voltage Failure Detection |
摘要 |
An integrated circuit is provided with a bandgap voltage reference circuit having a bandgap reference voltage output. A bandgap failure detection circuit is coupled to the bandgap reference voltage output. The bandgap failure detection forms a model value of the reference voltage from a first time, compares a present value of the reference voltage at a second time to the model value; and asserts a bandgap fail signal to indicate when the present value is less than the model value by a threshold value. The integrated circuit is reset by the bandgap fail signal. The detection circuit may be operated from a failsafe voltage domain that also allows a critical circuit to complete a pending operation during a reset. |
申请公布号 |
US2015286236(A1) |
申请公布日期 |
2015.10.08 |
申请号 |
US201414247918 |
申请日期 |
2014.04.08 |
申请人 |
Texas Instruments Deutschland GmbH |
发明人 |
Dornseifer Frank;Arnold Matthias;Gerber Johannes |
分类号 |
G05F3/08 |
主分类号 |
G05F3/08 |
代理机构 |
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代理人 |
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主权项 |
1. A method for operating a device, the method comprising:
producing a reference voltage from a source of primary power using a bandgap voltage reference circuit within the device; forming a model value of the reference voltage from a first time; comparing a present value of the reference voltage at a second time to the model value; and resetting the device when the present value is less than the model value by a threshold value. |
地址 |
Freising DE |