发明名称 Bandgap Reference Voltage Failure Detection
摘要 An integrated circuit is provided with a bandgap voltage reference circuit having a bandgap reference voltage output. A bandgap failure detection circuit is coupled to the bandgap reference voltage output. The bandgap failure detection forms a model value of the reference voltage from a first time, compares a present value of the reference voltage at a second time to the model value; and asserts a bandgap fail signal to indicate when the present value is less than the model value by a threshold value. The integrated circuit is reset by the bandgap fail signal. The detection circuit may be operated from a failsafe voltage domain that also allows a critical circuit to complete a pending operation during a reset.
申请公布号 US2015286236(A1) 申请公布日期 2015.10.08
申请号 US201414247918 申请日期 2014.04.08
申请人 Texas Instruments Deutschland GmbH 发明人 Dornseifer Frank;Arnold Matthias;Gerber Johannes
分类号 G05F3/08 主分类号 G05F3/08
代理机构 代理人
主权项 1. A method for operating a device, the method comprising: producing a reference voltage from a source of primary power using a bandgap voltage reference circuit within the device; forming a model value of the reference voltage from a first time; comparing a present value of the reference voltage at a second time to the model value; and resetting the device when the present value is less than the model value by a threshold value.
地址 Freising DE