发明名称 半導体装置の作製方法
摘要 <p>An embodiment is a manufacturing method of a semiconductor device including the steps of forming a first insulating film; forming a first mask over the first insulating film; performing a slimming process on the first mask to form a second mask; performing an etching process on the first insulating film using the second mask to form a second insulating film; forming a first conductive film covering the second insulating film; performing a polishing process on the first conductive film and the second insulating film to form a third insulating film, a source electrode, and a drain electrode having equal thicknesses; forming an oxide semiconductor film over the third insulating film, the source electrode, and the drain electrode; forming a gate insulating film over the oxide semiconductor film; and forming a gate electrode in a region which is over the gate insulating film and overlaps with the third insulating film.</p>
申请公布号 JP5789398(B2) 申请公布日期 2015.10.07
申请号 JP20110084321 申请日期 2011.04.06
申请人 发明人
分类号 H01L21/336;H01L21/28;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115;H01L27/146;H01L29/417;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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