发明名称 半導体装置およびその製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device of a structure which can reduce the number of processes and improve productivity, and to provide a manufacturing method of the same. <P>SOLUTION: A semiconductor device manufacturing method comprises: a step of forming a trench 2 on a semiconductor layer 1; a step of forming an insulation film 3 on the semiconductor layer 1 so as to cover an inside wall of a trench 2 and a surface outside the trench 2; a step of forming a conductive polysilicon film 4 so as to fully fill the trench 2 and be deposited on the insulation film 3 outside the trench 2; and a polysilicon etching step of selectively removing the polysilicon film 4 so as to leave the polysilicon film 4 inside the trench 2 and in a predetermined region on the insulation film 3 outside the trench 2. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5788678(B2) 申请公布日期 2015.10.07
申请号 JP20110000605 申请日期 2011.01.05
申请人 发明人
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L21/76;H01L21/768;H01L21/822;H01L21/8234;H01L23/532;H01L27/04;H01L27/06;H01L27/088;H01L29/12;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/28
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