发明名称 |
SEMICONDUCTOR STRUCTURE WITH ANTI-ETCH STRUCTURE IN VIA AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A semiconductor structure includes a semiconductor substrate, a dielectric layer formed over the semiconductor substrate, a first anti-etch layer, a second anti-etch layer, and a conductive material. The dielectric layer has an opening. The first anti-etch layer is formed on the sidewall of the opening and made of a material having resistance to peroxide. The second anti-etch layer is formed over the first anti-etch layer and made of a material having resistance to acid. The conductive material is formed within the opening and in contact with the second anti-etch layer. |
申请公布号 |
KR20150112750(A) |
申请公布日期 |
2015.10.07 |
申请号 |
KR20140193310 |
申请日期 |
2014.12.30 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHANG GENG SHUOH;WU CHUN SHENG;LIN CHUN LI;LI YI FANG;LEU PO HSIUNG;LIU DING I |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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