发明名称 SEMICONDUCTOR STRUCTURE WITH ANTI-ETCH STRUCTURE IN VIA AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor structure includes a semiconductor substrate, a dielectric layer formed over the semiconductor substrate, a first anti-etch layer, a second anti-etch layer, and a conductive material. The dielectric layer has an opening. The first anti-etch layer is formed on the sidewall of the opening and made of a material having resistance to peroxide. The second anti-etch layer is formed over the first anti-etch layer and made of a material having resistance to acid. The conductive material is formed within the opening and in contact with the second anti-etch layer.
申请公布号 KR20150112750(A) 申请公布日期 2015.10.07
申请号 KR20140193310 申请日期 2014.12.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHANG GENG SHUOH;WU CHUN SHENG;LIN CHUN LI;LI YI FANG;LEU PO HSIUNG;LIU DING I
分类号 H01L21/768 主分类号 H01L21/768
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