发明名称 |
Storage control apparatus, method of setting reference time, and computer-readable storage medium storing reference time setting program |
摘要 |
With a command delay time measurement unit that issues a first test command while the medium error status generator generates the medium error status, and measures a delay time of a command response for the first test command as a command delay time, and a response interval measurement unit that issues a plurality of second test commands to the storage apparatuses to be examined under a higher load when no error occurs, and measures an interval of each command response for the plurality of second test commands as a response interval, and by calculating, for each of the plurality of types of the storage apparatuses, a reference time for each storage apparatus type by adding the command delay time and the response interval, an error can be detected more efficiently. |
申请公布号 |
US9152519(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201313858130 |
申请日期 |
2013.04.08 |
申请人 |
FUJITSU LIMITED |
发明人 |
Ando Shun;Noda Yuji |
分类号 |
G06F11/00;G06F11/26;G06F11/07;G06F3/06 |
主分类号 |
G06F11/00 |
代理机构 |
Fujitsu Patent Center |
代理人 |
Fujitsu Patent Center |
主权项 |
1. A storage control apparatus that is capable of being connected to storage apparatuses of a plurality of types, the storage control apparatus comprising:
a storage apparatus selector that selects storage apparatuses to be examined from each of the plurality of types of the storage apparatuses; a medium error status generator that generates a medium error status in the storage apparatuses to be examined; a command delay time measurement unit that issues a first test command while the medium error status generator generates the medium error status, and measures a delay time of a command response for the first test command as a command delay time; a response interval measurement unit that issues a plurality of second test commands to the storage apparatuses to be examined under a higher load when no error occurs, and measures an interval of each command response for the plurality of second test commands as a response interval; a reference time calculator that calculates, for each of the plurality of types of the storage apparatuses, a reference time for each storage apparatus type by adding the command delay time and the response interval; and an abnormality detector that detects an abnormality upon issuing a command to the storage apparatuses, based on the reference time calculated by the reference time calculator. |
地址 |
Kawasaki JP |