发明名称 Storage control apparatus, method of setting reference time, and computer-readable storage medium storing reference time setting program
摘要 With a command delay time measurement unit that issues a first test command while the medium error status generator generates the medium error status, and measures a delay time of a command response for the first test command as a command delay time, and a response interval measurement unit that issues a plurality of second test commands to the storage apparatuses to be examined under a higher load when no error occurs, and measures an interval of each command response for the plurality of second test commands as a response interval, and by calculating, for each of the plurality of types of the storage apparatuses, a reference time for each storage apparatus type by adding the command delay time and the response interval, an error can be detected more efficiently.
申请公布号 US9152519(B2) 申请公布日期 2015.10.06
申请号 US201313858130 申请日期 2013.04.08
申请人 FUJITSU LIMITED 发明人 Ando Shun;Noda Yuji
分类号 G06F11/00;G06F11/26;G06F11/07;G06F3/06 主分类号 G06F11/00
代理机构 Fujitsu Patent Center 代理人 Fujitsu Patent Center
主权项 1. A storage control apparatus that is capable of being connected to storage apparatuses of a plurality of types, the storage control apparatus comprising: a storage apparatus selector that selects storage apparatuses to be examined from each of the plurality of types of the storage apparatuses; a medium error status generator that generates a medium error status in the storage apparatuses to be examined; a command delay time measurement unit that issues a first test command while the medium error status generator generates the medium error status, and measures a delay time of a command response for the first test command as a command delay time; a response interval measurement unit that issues a plurality of second test commands to the storage apparatuses to be examined under a higher load when no error occurs, and measures an interval of each command response for the plurality of second test commands as a response interval; a reference time calculator that calculates, for each of the plurality of types of the storage apparatuses, a reference time for each storage apparatus type by adding the command delay time and the response interval; and an abnormality detector that detects an abnormality upon issuing a command to the storage apparatuses, based on the reference time calculated by the reference time calculator.
地址 Kawasaki JP