发明名称 Error check and correction circuit and semiconductor memory
摘要 An error check and correction circuit includes a Chien search unit. The Chien search unit includes a calculation circuit and a plurality of Chien search circuits. The calculation circuit is configured to calculate a first bit stream by multiplying a value of (n−k) bits by a plurality of elements and a second bit stream by multiplying a value of k bits by the plurality of elements. The plurality of Chien search circuits configured to calculate the element by connecting the first bit stream and the second bit stream, and substitute the calculated element into the error correction search equation.
申请公布号 US9152493(B2) 申请公布日期 2015.10.06
申请号 US201314024890 申请日期 2013.09.12
申请人 Samsung Electronics Co., Ltd. 发明人 Fujiwara Daisuke;Hirano Makoto
分类号 G06F11/10;H03M13/15;H03M13/00 主分类号 G06F11/10
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. An error check and correction circuit comprising: a Chien search unit configured to determine whether there is an error in each data stream using an element of a Galois field GF having 2n elements as a substituted value in an error location search equation, where n is a natural number, the Chien search unit including, a calculation circuit configured to, calculate a first bit stream by multiplying a value of (n-k) bits by a plurality of elements, where k is a natural number, andcalculate a second bit stream by multiplying a value of k bits by the plurality of elements; anda plurality of Chien search circuits arranged in a matrix in row and column directions having the first bit stream provided in a first one of the row and column direction and the second bit stream provided in a second one of the row and column direction, the plurality of Chien search circuits configured to,calculate the element by connecting the first bit stream and the second bit stream, andsubstitute the calculated element into the error correction search equation.
地址 Gyeonggi-do KR