发明名称 Semiconductor device and a method for manufacturing a semiconductor device
摘要 There is provided a readily manufacturable semiconductor device including two transistors having mutually different characteristics. The semiconductor device includes a substrate, a multilayer wiring layer disposed over the substrate, a first transistor disposed in the multilayer wiring layer, and a second transistor disposed in a layer different from a layer including the first transistor disposed therein of the multilayer wiring layer, and having different characteristics from those of the first transistor. This can provide a readily manufacturable semiconductor device including two transistors having mutually different characteristics.
申请公布号 US9153588(B2) 申请公布日期 2015.10.06
申请号 US201313738137 申请日期 2013.01.10
申请人 RENESAS ELECTRONICS CORPORATION 发明人 Sunamura Hiroshi;Inoue Naoya;Kaneko Kishou
分类号 H01L27/105;H01L21/02;H01L27/06;H01L27/108;H01L29/788;H01L29/792;H01L27/11;H01L27/12;H01L27/24;H01L27/088;H01L27/092;H01L27/10;H01L27/115 主分类号 H01L27/105
代理机构 Young & Thompson 代理人 Young & Thompson
主权项 1. A semiconductor device, comprising: a substrate; a multilayer wiring layer disposed over the substrate; a first transistor disposed in the multilayer wiring layer; and a second transistor disposed in a different layer from a layer including the first transistor disposed therein of the multilayer wiring layer, wherein the first transistor and the second transistor are coupled to each other through source/drain electrodes of each of the first transistor and the second transistor being coupled to each other through a first via, and a gate electrode of the first transistor is coupled to a gate electrode of the second transistor through a second via thereby forming an inverter from the first transistor and the second transistor.
地址 Kanagawa JP