发明名称 |
Semiconductor device and a method for manufacturing a semiconductor device |
摘要 |
There is provided a readily manufacturable semiconductor device including two transistors having mutually different characteristics. The semiconductor device includes a substrate, a multilayer wiring layer disposed over the substrate, a first transistor disposed in the multilayer wiring layer, and a second transistor disposed in a layer different from a layer including the first transistor disposed therein of the multilayer wiring layer, and having different characteristics from those of the first transistor. This can provide a readily manufacturable semiconductor device including two transistors having mutually different characteristics. |
申请公布号 |
US9153588(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201313738137 |
申请日期 |
2013.01.10 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
Sunamura Hiroshi;Inoue Naoya;Kaneko Kishou |
分类号 |
H01L27/105;H01L21/02;H01L27/06;H01L27/108;H01L29/788;H01L29/792;H01L27/11;H01L27/12;H01L27/24;H01L27/088;H01L27/092;H01L27/10;H01L27/115 |
主分类号 |
H01L27/105 |
代理机构 |
Young & Thompson |
代理人 |
Young & Thompson |
主权项 |
1. A semiconductor device, comprising:
a substrate; a multilayer wiring layer disposed over the substrate; a first transistor disposed in the multilayer wiring layer; and a second transistor disposed in a different layer from a layer including the first transistor disposed therein of the multilayer wiring layer, wherein the first transistor and the second transistor are coupled to each other through source/drain electrodes of each of the first transistor and the second transistor being coupled to each other through a first via, and a gate electrode of the first transistor is coupled to a gate electrode of the second transistor through a second via thereby forming an inverter from the first transistor and the second transistor. |
地址 |
Kanagawa JP |