发明名称 Scan driving circuit and method of repairing the same
摘要 A scan driving circuit includes a shift register configured to sequentially output a first scan signal to scan lines through respective first output lines during a first section of a frame period, a simultaneous switching block configured to simultaneously output a second scan signal to the scan lines through respective second output lines during a second section of the frame period, the first and second periods of the frame period being different from each other, a switching device electrically connected to the second output line, and a repair line across the first output line and the second output line.
申请公布号 US9152251(B2) 申请公布日期 2015.10.06
申请号 US201213477204 申请日期 2012.05.22
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 Jin Guang-Hai;Choi Jae-Beom;Jung Kwan-Wook;Lee June-Woo;Kim Moo-Jin;Choi Jong-Hyun
分类号 G09G3/30;G09G3/32;G06F3/038 主分类号 G09G3/30
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A scan driving circuit, comprising: a plurality of shift registers to sequentially output first scan signals to scan lines through shift register output lines during a first section of a frame period; a plurality of simultaneous switching blocks to simultaneously output second scan signals to the scan lines through simultaneous switching block output lines during a second section of the frame period, the first and second sections of the frame period being different from each other; a plurality of switching devices between the simultaneous switching block output lines and the scan lines; and a repair line across the shift register output lines and the simultaneous switching block output lines, wherein: the plurality of simultaneous switching blocks include a normal simultaneous switching block and a defective simultaneous switching block, the normal simultaneous switching block connected to a first scan line of the scan lines through a first switching device of the switching devices and a first simultaneous switching block output line of the simultaneous switching block output lines, the defective simultaneous switching block connected to a second scan line of the scan lines through a second switching device of the switching devices and a second simultaneous switching block output line of the simultaneous switching block output lines, the first simultaneous switching block output line connected to the normal simultaneous switching block is electrically connected to the second simultaneous switching block output line connected to the defective simultaneous switching block through the repair line, and the normal simultaneous switching block simultaneously supplies a corresponding second scan signal of the second scan signals to the first scan line and the second scan line.
地址 Yongin, Gyeonggi-Do KR