发明名称 Polishing composition, polishing method using same, and method for producing semiconductor device
摘要 The polishing composition of the present invention contains an oxidizing agent and a scratch-reducing agent represented by general formula (1) or (2) below.; In the formulas, X1 and X2 are each independently a hydrogen atom, a hydroxyl group, a carboxyl group, a phosphate group, an alkyl group, an aryl group, an alkyl polyamine group, an alkyl polyphosphate group, an alkyl polycarboxylate group, an alkyl polyaminopolyphosphate group, or an alkyl polyaminopolycarboxylate group.
申请公布号 US9150758(B2) 申请公布日期 2015.10.06
申请号 US201214007272 申请日期 2012.03.28
申请人 FUJIMI INCORPORATED 发明人 Miller Anne;Saito Chiaki;Fukuda Kanako
分类号 H01L21/302;H01L21/461;B44C1/22;C23F1/00;C03C15/00;C03C25/68;C09G1/02;H01L21/304;H01L21/321;B24B37/04;C09K3/14;H01L21/306;H01L21/768;C09G1/00;C09G1/04 主分类号 H01L21/302
代理机构 Foley & Lardner LLP 代理人 Foley & Lardner LLP
主权项 1. A polishing composition used in polishing a surface of an object to be polished that includes a first portion comprised of copper or a copper alloy and a second portion comprised of tantalum, tantalum nitride, a tantalum alloy, titanium, titanium nitride, a titanium alloy, tungsten, tungsten nitride, or a tungsten alloy, the composition comprising an oxidizing agent and a scratch-reducing agent represented by general formula (1) or (2) below,where X1 and X2 are each independently a hydrogen atom, a hydroxyl group, a carboxyl group, an alkyl group, an aryl group, an alkyl polyamine group, an alkyl polycarboxylate group, an alkyl polyaminopolyphosphate group, or an alkyl polyaminopolycarboxylate group, wherein the polishing composition has a polishing rate of the second portion higher than that of the first portion.
地址 Kiyosu-Shi JP