发明名称 Semiconductor device for preventing a progression of a crack in a solder layer and method of manufacturing the same
摘要 A semiconductor device has a connection structure in which a power semiconductor chip is mounted on an insulating substrate having conductor patterns bonded to front and rear surfaces thereof and the insulating substrate is bonded to a heat-dissipating base member to dissipate heat generated from the power semiconductor chip to outside. The conductor pattern bonded to the heat-dissipating base member is formed such that a thickness of a circumferential portion of a bonding surface of the conductor pattern bonded to the insulating substrate is less than that of a center of the bonding portion.
申请公布号 US9153519(B2) 申请公布日期 2015.10.06
申请号 US201214110935 申请日期 2012.05.11
申请人 FUJI ELECTRIC CO., LTD. 发明人 Nagaune Fumio
分类号 H01L23/34;H01L21/50;H01L23/00;H01L23/24;H01L23/36;H01L23/498;H01L23/373 主分类号 H01L23/34
代理机构 代理人 Kanesaka Manabu
主权项 1. A semiconductor device comprising: an insulating substrate having first and second conductor patterns, each having a bonding portion, the first conductor pattern being bonded to a front surface thereof and the second conductor pattern having four corner portions and being bonded to a rear surface thereof, a power semiconductor chip mounted on the first conductor pattern, and a heat-dissipating base member bonded to the second conductor pattern to dissipate heat generated from the power semiconductor chip to outside, wherein the second conductor pattern is formed such that a circumferential portion of the bonding portion of the second conductor pattern has a thickness less than that of a center of the bonding portion thereof, and the second conductor pattern has a curved surface at each of the four corner portions such that a circumference of each of the four corner portions is outwardly curved.
地址 Kawasaki-Shi, Kanagawa JP