发明名称 |
Semiconductor device for preventing a progression of a crack in a solder layer and method of manufacturing the same |
摘要 |
A semiconductor device has a connection structure in which a power semiconductor chip is mounted on an insulating substrate having conductor patterns bonded to front and rear surfaces thereof and the insulating substrate is bonded to a heat-dissipating base member to dissipate heat generated from the power semiconductor chip to outside. The conductor pattern bonded to the heat-dissipating base member is formed such that a thickness of a circumferential portion of a bonding surface of the conductor pattern bonded to the insulating substrate is less than that of a center of the bonding portion. |
申请公布号 |
US9153519(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201214110935 |
申请日期 |
2012.05.11 |
申请人 |
FUJI ELECTRIC CO., LTD. |
发明人 |
Nagaune Fumio |
分类号 |
H01L23/34;H01L21/50;H01L23/00;H01L23/24;H01L23/36;H01L23/498;H01L23/373 |
主分类号 |
H01L23/34 |
代理机构 |
|
代理人 |
Kanesaka Manabu |
主权项 |
1. A semiconductor device comprising:
an insulating substrate having first and second conductor patterns, each having a bonding portion, the first conductor pattern being bonded to a front surface thereof and the second conductor pattern having four corner portions and being bonded to a rear surface thereof, a power semiconductor chip mounted on the first conductor pattern, and a heat-dissipating base member bonded to the second conductor pattern to dissipate heat generated from the power semiconductor chip to outside, wherein the second conductor pattern is formed such that a circumferential portion of the bonding portion of the second conductor pattern has a thickness less than that of a center of the bonding portion thereof, and the second conductor pattern has a curved surface at each of the four corner portions such that a circumference of each of the four corner portions is outwardly curved. |
地址 |
Kawasaki-Shi, Kanagawa JP |