发明名称 |
Apparatus and method for FinFETs |
摘要 |
A FinFET comprises an isolation region formed in a substrate, a cloak-shaped active region formed over the substrate, wherein the cloak-shaped active region has an upper portion protruding above a top surface of the isolation region. In addition, the FinFET comprises a gate electrode wrapping the channel of the cloak-shaped active region. |
申请公布号 |
US9153582(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201414251780 |
申请日期 |
2014.04.14 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lee Yi-Jing;Lin You-Ru;Wan Cheng-Tien;Wu Cheng-Hsien;Ko Chih-Hsin |
分类号 |
H01L27/088;H01L21/02;H01L29/66;H01L29/78;H01L21/762 |
主分类号 |
H01L27/088 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A method comprising:
forming a first isolation region in a substrate; forming a second isolation region in the substrate; forming a recess between the first isolation region and the second isolation region by removing a portion of the substrate; performing a surface treatment on the recess to form a cloak-shaped recess, wherein the cloak-shaped recess extends into the first isolation region and the second isolation region; and forming a cloak-shaped active region through an epitaxial growth. |
地址 |
Hsin-Chu TW |