发明名称 Apparatus and method for FinFETs
摘要 A FinFET comprises an isolation region formed in a substrate, a cloak-shaped active region formed over the substrate, wherein the cloak-shaped active region has an upper portion protruding above a top surface of the isolation region. In addition, the FinFET comprises a gate electrode wrapping the channel of the cloak-shaped active region.
申请公布号 US9153582(B2) 申请公布日期 2015.10.06
申请号 US201414251780 申请日期 2014.04.14
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lee Yi-Jing;Lin You-Ru;Wan Cheng-Tien;Wu Cheng-Hsien;Ko Chih-Hsin
分类号 H01L27/088;H01L21/02;H01L29/66;H01L29/78;H01L21/762 主分类号 H01L27/088
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method comprising: forming a first isolation region in a substrate; forming a second isolation region in the substrate; forming a recess between the first isolation region and the second isolation region by removing a portion of the substrate; performing a surface treatment on the recess to form a cloak-shaped recess, wherein the cloak-shaped recess extends into the first isolation region and the second isolation region; and forming a cloak-shaped active region through an epitaxial growth.
地址 Hsin-Chu TW