发明名称 |
Semiconductor device manufacturing method |
摘要 |
An objective of the present invention is to increase production efficiency of high-performance flexible semiconductor devices. A semiconductor device manufacturing method includes: a step of forming an insulating substrate (10) which is configured of glass substrates (11, 13) with a thermal expansion coefficient which approximates the thermal expansion coefficient of a single-crystal silicon substrate (20) and a plastic substrate (12) which is positioned between both of the glass substrates; and a step of, after bonding the insulating substrate (10) with the single-crystal silicon substrate (20), separating a portion of the single-crystal silicon substrate (20) with heat processing, and forming a single-crystal silicon layer (14) upon the glass substrate (11). |
申请公布号 |
US9153474(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201314385756 |
申请日期 |
2013.03.11 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
Suga Katsuyuki |
分类号 |
H01L21/30;H01L21/46;H01L21/762;H01L27/12 |
主分类号 |
H01L21/30 |
代理机构 |
Chen Yoshimura LLP |
代理人 |
Chen Yoshimura LLP |
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
implanting ions into a single-crystal semiconductor substrate to form a separation layer at a prescribed depth therein; forming an insulating substrate that includes a first substrate, a third substrate, and a second substrate disposed therebetween, the first substrate and the third substrate having a coefficient of thermal expansion similar to a coefficient of thermal expansion of said single-crystal semiconductor substrate, the insulating substrate having flexible characteristics; bonding the single-crystal semiconductor substrate to the insulating substrate such that the single-crystal semiconductor substrate and the first substrate are joined together; and forming a single-crystal semiconductor layer on the insulating substrate by separating a portion of the single-crystal semiconductor substrate from the separation layer through heat treatment. |
地址 |
Osaka JP |