发明名称 Substrate processing apparatus, method of manufacturing semiconductor device and program
摘要 Provided is a substrate processing apparatus. The substrate processing apparatus includes: a process chamber configured to accommodate a substrate; a substrate holding member configured to hold the substrate in the process chamber; a first gas supply system including a first gas supply hole for supplying a first process gas into the process chamber; a second gas supply system including a second gas supply hole for supplying a second process gas into the process chamber; and a catalyst supply system including a catalyst supply hole for supplying a catalyst into the process chamber, wherein an angle between a first imaginary line connecting a center of the substrate holding member and the first gas supply hole and a second imaginary line connecting the center of the substrate holding member and the catalyst supply hole ranges from 63.5 degrees to 296.5 degrees.
申请公布号 US9153430(B2) 申请公布日期 2015.10.06
申请号 US201213725953 申请日期 2012.12.21
申请人 Hitachi Kokusai Electric Inc. 发明人 Noda Takaaki;Wang Jie
分类号 H01L21/31;H01L21/02;H01L21/673;C23C16/40;C23C16/455 主分类号 H01L21/31
代理机构 Edell, Shapiro & Finnan LLC 代理人 Edell, Shapiro & Finnan LLC
主权项 1. A substrate processing apparatus comprising: a process chamber configured to accommodate a substrate; a substrate holding member configured to hold the substrate in the process chamber; a first gas supply system including a first gas supply hole for supplying a first process gas into the process chamber; a second gas supply system including a second gas supply hole for supplying a second process gas into the process chamber; and a catalyst supply system including a catalyst supply hole for supplying a catalyst into the process chamber, wherein an angle between a first imaginary line connecting a center of the substrate holding member and the first gas supply hole and a second imaginary line connecting the center of the substrate holding member and the catalyst supply hole ranges from 63.5 degrees to 296.5 degrees.
地址 Tokyo JP