发明名称 Sacroiliac fusion system
摘要 An undercutting system for preparing a region between an ilium and a sacrum for sacroiliac fusion. The undercutting system includes an insertion apparatus, a probe assembly and a cutting assembly. The probe assembly is operably mounted to the insertion apparatus. The probe assembly is moveable with respect to the insertion apparatus between a retracted configuration and an extended configuration. In the extended configuration at least a portion of the probe assembly extends from the insertion apparatus. The cutting assembly is operably mounted with respect to the probe assembly and the insertion apparatus. The cutting assembly is movable with respect to the insertion apparatus between a retracted configuration and an extended configuration. In the extended configuration at least a portion of the cutting assembly extends from the insertion apparatus.
申请公布号 US9149283(B2) 申请公布日期 2015.10.06
申请号 US201313803630 申请日期 2013.03.14
申请人 Zyga Technology, Inc. 发明人 Assell Robert L.;Carr Jeremy Thomas;Dickhudt Eugene Arthur;Berg Thomas Godfrey;Beaubien Brian P.
分类号 A61B17/32;A61B17/16;A61B17/84;A61B17/3203;A61B17/70;A61B17/00;A61B17/3207;A61B19/00 主分类号 A61B17/32
代理机构 Dicke, Billig & Czaja, PLLC 代理人 Dicke, Billig & Czaja, PLLC
主权项 1. An undercutting system for preparing a region between an ilium and a sacrum for sacroiliac fusion, wherein the undercutting system comprises: an insertion apparatus; a probe assembly that is moveable with respect to the insertion apparatus between a retracted configuration and an extended configuration, wherein in the extended configuration at least a portion of the probe assembly extends from the insertion apparatus; and a cutting assembly that is movable with respect to the insertion apparatus between a retracted configuration and an extended configuration, wherein in the extended configuration at least a portion of the cutting assembly extends from the insertion apparatus, wherein the cutting assembly extends over at least a portion of the probe assembly, wherein the cutting assembly is sharper than the probe assembly and wherein the cutting assembly has a plurality of kerfs formed therein.
地址 Minnetonka MN US