发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a manufacturing method of a highly-reliable semiconductor memory at low cost.SOLUTION: A first side wall film 64 is formed on a side wall of a core material film 63, and a second side wall film 65 is formed on a side wall of the first side wall film 64. A mask layer 67 is formed to cover the second side wall film 65. The mask layer 67 and the first side wall film 64 are processed into plural island patterns. A base mask 62 is processed by using the core material film 63, the first side wall film 64, the second side wall film 65 and the mask layer 67 as a mask. Plural mask slits extending in a first direction and plural mask holes are formed simultaneously on the base mask 62.</p>
申请公布号 JP2015177053(A) 申请公布日期 2015.10.05
申请号 JP20140052667 申请日期 2014.03.14
申请人 TOSHIBA CORP 发明人 TSUJI MASAKI;FUKUZUMI YOSHIAKI
分类号 H01L21/8247;H01L21/336;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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