发明名称 APPARATUS AND METHOD FOR TREATING A SUBSTRATE
摘要 Provided is a substrate processing apparatus. The substrate processing apparatus has: a processing chamber, an air emitting chamber, a load lock chamber, and an exhaust unit. The air emitting chamber emits air inside an object to be treated by decompressing at lower speed than the decompressing speed in the processing chamber, and thereby prevents a warpage phenomenon of a substrate. The air emitting chamber treats air emission for a plurality of objects to be treated at once, and thereby can reduce the process time.
申请公布号 KR20150110947(A) 申请公布日期 2015.10.05
申请号 KR20140033508 申请日期 2014.03.21
申请人 PSK INC. 发明人 KIM, TAE HOON
分类号 H01L21/302;H01L21/02;H01L21/3065 主分类号 H01L21/302
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