| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a defect detection device configured to detect a defect of an object without affine transformation, in inspecting the appearance by use of a line sensor that images an annular or sectoral inspection area of the rotating object in a rotation radial direction or a substantial rotation radial direction.SOLUTION: An area dividing section of an image processing board 15 in a defect inspection device divides a pixel arrangement area of raw image data captured by a line sensor camera 5 or processed image data of the raw image data, in a main scanning direction which is orthogonal to a rotating direction of an object 3 and a sub-scanning direction which is parallel to the rotating direction of the object, into a plurality of first blocks. A size reduction section reduces the size of each of the first blocks in the sub-scanning direction, according to distance from a rotation center of the object, to obtain raw image data or processed image data divided into a plurality of second blocks. A defect detection section detects a defect in each of the second blocks.</p> |
