| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a step-down converter circuit capable of performing probe tests to a plurality of elements in the circuit simultaneously without connecting an external element.SOLUTION: A test in which a high voltage side switching element TH is driven is performed by closing a switch G5 and opening a switch G6 in a state where a short circuit is formed between a first pad P1 and a second pad P2 and a differential signal Vdif amplified in an amplifier 1 is input to a first input of a comparator 4 by a first selector 11 while an output signal of the comparator 4 is input in a second input of the comparator 4 by a second selector 12, and a test in which a low voltage side switching element TL is driven is performed by opening the switch G5 and closing the switch G6.</p> |
